Electronic structure of (Pb,La)(Zr,Ti)O3 thin film probed by soft-X-ray spectroscopy

被引：5

作者：

Higuchi, T ^{[1
]}

Tsukamoto, T

Hattori, T

Honda, Y

Yokoyama, S

Funakubo, H

机构：

[1] Tokyo Univ Sci, Dept Appl Phys, Tokyo 1628601, Japan

[2] Tokyo Inst Technol, Dept Innovat & Engn Mat, Yokohama, Kanagawa 2268502, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 9B期

关键词：

PZT; PLZT; thin film; X-ray absorption spectroscopy (XAS); soft-X-ray emission spectroscopy (SXES); electronic structure; hybridization effect;

D O I：

10.1143/JJAP.44.6923

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The electronic structure of (Pb,La)(Zr,Ti)O-3 (PLZT) thin film was studied by X-ray absorption spectroscopy and soft-X-ray emission spectroscopy (SXES). The Ti 3d and O 2p partial densities of states in the valence band region were observed in O 1 s and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the O 2p state, indicating the occurrence of the hybridization effect between the Ti 3d and O 2p states. The hybridization effect of PLZT thin film is lower than that of Pb(Zr,Ti)O-3 thin film. This finding indicates that the hybridization effect is closely related to the change in the bond length between Ti and O ions.

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收藏

页码：6923 / 6926

页数：4

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