Subspace-Based Optimization Method for Inverse Scattering Problems Utilizing Phaseless Data

This paper presents a novel variation of the subspace-based optimization method (SOM) to reconstruct the scatterer's permittivity profile by utilizing only phaseless measurements (i.e., intensity data of the total field with no phase information). Based on spectrum analysis, the contrast source is partitioned into two orthogonally complementary portions (viz., deterministic and ambiguous portions). The original SOM's procedure to obtain the deterministic portion has to be modified in order to accommodate the lack of phase information while the ambiguous portion is determined by another nonlinear optimization. The numerical results presented for the two examples of scatterers under transverse-electric incidence have demonstrated that the proposed method is capable of reconstructing complicated patterns with rapid rate of convergence and robust immunity to noise.