Growth mode during initial stage of chemical vapor deposition

被引:45
作者
Kajikawa, Y [1 ]
Noda, S [1 ]
机构
[1] Univ Tokyo, Sch Engn, Inst Engn Innovat, Dept Chem Syst Engn,Bunkyo Ku, Tokyo 1138656, Japan
基金
日本学术振兴会;
关键词
chemical vapor deposition; physical vapor deposition; growth mode; nucleation; nanoparticle;
D O I
10.1016/j.apsusc.2004.10.021
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The initial stage during vapor deposition has been extensively studied in physical vapor deposition (PVD) processes, and nucleation theories have been successfully used to model island nucleation processes during PVD. Compared with the extensive research in PVD, there has been less work on understanding the initial stage in chemical vapor deposition (CVD) processes, despite the technological and commercial importance of CVD-based manufacturing systems. In this work we briefly review the nucleation theories developed for PVD processes and consider the validity of them for modeling the initial stage of CVD processes. One characteristic of CVD processes is the existence of an incubation time. Recent research indicates that the incubation time can be caused by the different reactivity of precursors nucleating on substrates and islands. We proposed process indices to evaluate the relative importance of sticking probabilities and desorption of adsorbates on the incubation time. The differing precursor reactivity between islands and substrates may also affect the island growth mode. This situation in CVD processes differs from that in PVD processes, for which current nucleation theories were developed, and therefore prevents the direct application of PVD nucleation theories to CVD processes. Therefore, to model CVD processes, a nucleation model is needed that is sensitive to the different reactivity of precursors to islands and substrates. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:281 / 289
页数:9
相关论文
共 83 条
[51]   Atomic layer deposition of metal and nitride thin films: Current research efforts and applications for semiconductor device processing [J].
Kim, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (06) :2231-2261
[52]   The carrier gas and surface passivation effects on selectivity in chemical vapor deposition of copper films [J].
Kim, S ;
Park, JM ;
Choi, DJ .
THIN SOLID FILMS, 1998, 320 (01) :95-102
[53]   Carrier gas effects on the selectivity in chemical vapor deposition of copper [J].
Kim, S ;
Park, JM ;
Choi, DJ .
THIN SOLID FILMS, 1998, 315 (1-2) :229-237
[54]   Scaling regimes for second layer nucleation [J].
Krug, J .
EUROPEAN PHYSICAL JOURNAL B, 2000, 18 (04) :713-719
[55]   Influence of island mobility on island size distributions in surface growth [J].
Kuipers, L ;
Palmer, RE .
PHYSICAL REVIEW B, 1996, 53 (12) :R7646-R7649
[56]   MANIPULATION OF NUCLEATION SITES IN SOLID-STATE SI CRYSTALLIZATION [J].
KUMOMI, H ;
YONEHARA, T ;
NOMA, T .
APPLIED PHYSICS LETTERS, 1991, 59 (27) :3565-3567
[57]   Selective nucleation-based epitaxy (SENTAXY): A novel approach for thin film formation [J].
Kumomi, H ;
Yonehara, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (3B) :1383-1388
[58]   SELECTIVE NUCLEATION BASED EPITAXY (SENTAXY) - INVESTIGATION OF INITIAL NUCLEATION STAGES [J].
KUMOMI, H ;
YONEHARA, T ;
NISHIGAKI, Y ;
SATO, N .
APPLIED SURFACE SCIENCE, 1989, 41-2 :638-642
[59]   Thermal desorption effects in chemical vapor deposition of silicon nanoparticles [J].
Leach, WT ;
Zhu, JH ;
Ekerdt, JG .
JOURNAL OF CRYSTAL GROWTH, 2002, 243 (01) :30-40
[60]   NUCLEATION AND GROWTH OF CVD-W ON TIN STUDIED BY X-RAY-FLUORESCENCE SPECTROMETRY [J].
MARANGON, MS ;
QUEIROLO, G ;
SAVOIA, C .
APPLIED SURFACE SCIENCE, 1995, 91 (1-4) :157-161