Preparation and characterization of tin sulphide thin films by a spray pyrolysis technique

被引：54
|
作者：
Salah, HB [1 ]
Bouzouita, H [1 ]
Rezig, B [1 ]
机构：
[1] ENIT, Lab Photovola & Mat Semicond, Tunis 1002, Tunisia
来源：
THIN SOLID FILMS | 2005年 / 480卷
关键词：
spray; thin films; optical properties; structural properties; binary compounds;
D O I：
10.1016/j.tsf.2004.11.035
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have attempted the preparation and characterization of Sn2S3 thin films by using the spray pyrolysis technique. We started with acidic aqueous solutions including tin (II) chloride and thiourea, which were atomized with compressed air as carrier gas. The Sn2S3 thin films were obtained on glass substrates. Thin layers of Sn-S have been grown at various temperatures in the range of 275-325 degrees C and various [S/Sn] ratios. The structural properties have been determined by using X-ray diffraction (XRD). The changes observed in the structural phases during the film formation in dependence of growth temperatures are reported and discussed. The optical constants of the deposited films were obtained using the experimentally recorded transmission and reflectance spectral data as functions of the wavelength, in the range of 300-1800 run. An analysis of the deduced spectral absorption of the deposited films revealed an optical indirect band gap energy of 1.9-2.2 eV for Sn2S3 layers. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：439 / 442
页数：4
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