Revealing multiple classes of stable quantum emitters in hexagonal boron nitride with correlated optical and electron microscopy

被引:162
作者
Hayee, Fariah [1 ]
Yu, Leo [2 ]
Zhang, Jingyuan Linda [3 ]
Ciccarino, Christopher J. [4 ]
Nguyen, Minh [5 ]
Marshall, Ann F. [6 ]
Aharonovich, Igor [5 ]
Vuckovic, Jelena [3 ]
Narang, Prineha [4 ]
Heinz, Tony F. [2 ,7 ]
Dionne, Jennifer A. [8 ,9 ]
机构
[1] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
[3] Stanford Univ, EL Ginzton Lab, Stanford, CA 94305 USA
[4] Harvard Univ, John A Paulson Sch Engn & Appl Sci, Cambridge, MA 02138 USA
[5] Univ Technol Sydney, Sch Math & Phys Sci, Ultimo, NSW, Australia
[6] Stanford Univ, Stanford Nano Shared Facil, Stanford, CA 94305 USA
[7] SLAC Natl Accelerator Lab, Menlo Pk, CA USA
[8] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
[9] Stanford Univ, Dept Radiol, Stanford, CA 94305 USA
关键词
SINGLE-PHOTON EMISSION; POINT-DEFECTS;
D O I
10.1038/s41563-020-0616-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Defects in hexagonal boron nitride exhibit room-temperature quantum emission, but their unknown structural origin challenges their technological utility. A combination of optical and electron microscopy helps to distinguish at least four classes of defects and correlate them with local strain. Defects in hexagonal boron nitride (hBN) exhibit high-brightness, room-temperature quantum emission, but their large spectral variability and unknown local structure challenge their technological utility. Here, we directly correlate hBN quantum emission with local strain using a combination of photoluminescence (PL), cathodoluminescence (CL) and nanobeam electron diffraction. Across 40 emitters, we observe zero phonon lines (ZPLs) in PL and CL ranging from 540 to 720 nm. CL mapping reveals that multiple defects and distinct defect species located within an optically diffraction-limited region can each contribute to the observed PL spectra. Local strain maps indicate that strain is not required to activate the emitters and is not solely responsible for the observed ZPL spectral range. Instead, at least four distinct defect classes are responsible for the observed emission range, and all four classes are stable upon both optical and electron illumination. Our results provide a foundation for future atomic-scale optical characterization of colour centres.
引用
收藏
页码:534 / +
页数:8
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