Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements

被引：2

作者：

Assoufid, L ^{[1
]}

Lang, J ^{[1
]}

Wang, J ^{[1
]}

Srajer, G ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

ADVANCES IN MIRROR TECHNOLOGY FOR SYNCHROTRON X-RAY AND LASER APPLICATIONS | 1998年 / 3447卷

关键词：

long trace profiler; metrology; x-ray mirror; synchrotron radiation;

D O I：

10.1117/12.331123

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper describes metrology of a vertically focusing mirror on the bending magnet beamline in sector-1 of the Advanced Photon Source, Argonne National Laboratory. The mirror was evaluated using measurements from both an optical long trace profiler and x-rays. Slope error profiles obtained with the two methods were compared and were found to be in a good agreement. Further comparisons were made between x-ray measurements and results from the SHADOW ray-tracing code.

引用

页码：109 / 116

页数：8