Atomic-Scale Mechanisms of Sliding along an Interdiffused Li-Si-Cu Interface

被引:15
|
作者
Wang, Haoran [1 ]
Hou, Binyue [1 ]
Wang, Xueju [2 ]
Xia, Shuman [2 ]
Chew, Huck Beng [1 ]
机构
[1] Univ Illinois, Dept Aerosp Engn, Urbana, IL 61801 USA
[2] Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
silicon electrode; copper current collector; interface sliding; delamination; density functional theory; LITHIUM-ION BATTERIES; THIN-FILM ELECTRODES; LITHIATED SILICON; FRACTURE; CAPACITY; STORAGE; ALLOYS; ANODE;
D O I
10.1021/nl5043837
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We perform ab initio calculations On the shear deformation response of the interdiffused Li-Si-Cu phase structure existing between a lithiated Si electrode and a Cu current collector. We show that the formation of well-delineated and weakly bonded Si-Cu and Li-Cu crystalline atomic layers within this phase structure, facilitates interface sliding. HoweVer, sliditig can be terminated by the-formation of LiSi3 compounds across these atomic layers, which causes the abrupt capacity fade of the electrode aftet repeated cycling.
引用
收藏
页码:1716 / 1721
页数:6
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