Logic design for on-chip test clock generation - Implementation details and impact on delay test quality

被引：27

作者：

Beck, M ^{[1
]}

Barondeau, O ^{[1
]}

Kaibel, M ^{[1
]}

Poehl, F ^{[1
]}

Lin, XJ ^{[1
]}

Press, R ^{[1
]}

机构：

[1] Infineon Technol AG, D-81541 Munich, Germany

来源：

DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS | 2005年

关键词：

D O I：

10.1109/DATE.2005.199

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper addresses delay test for SOC devices with high frequency clock domains. A logic design for on chip high-speed clock generation, implemented to avoid expensive test equipment, is described in detail. Techniques for on-chip clock generation, meant to reduce test vector count and to increase test quality, are discussed. ATPG results for the proposed techniques are given.

引用

页码：56 / 61

页数：6

共 22 条

[1] OPMISR: The foundation for compressed ATPG vectors [J].

Barnhart, C ;

Brunkhorst, V ;

Distler, F ;

Farnsworth, O ;

Keller, B ;

Koenemann, B .

INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, :748-757

[2] Use of DFT techniques in speed grading a 1GHz+ microprocessor [J].

Belete, D ;

Razdan, A ;

Schwarz, W ;

Raina, R ;

Hawkins, C ;

Morehead, J .

INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, :1111-1119

[3]

BOYER J, 2003, TEST MEASUREMENT WOR, P21

[4] DELAY-FAULT TEST-GENERATION AND SYNTHESIS FOR TESTABILITY UNDER A STANDARD SCAN DESIGN METHODOLOGY [J].

CHENG, KT ;

DEVADAS, S ;

KEUTZER, K .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1993, 12 (08) :1217-1231

[5]

Fetherston RS, 1997, INT TEST CONF P, P406, DOI 10.1109/TEST.1997.639643

[6]

FRANCO P, 1996, P ITC, P353

[7]

LESSER JD, 1980, IEEE T COMPUT, V29, P235, DOI 10.1109/TC.1980.1675555

[8] Test generation for designs with multiple clocks [J].

Lin, XJ ;

Thompson, R .

40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, 2003, :662-667

[9]

Maxwell PC, 1996, INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, P250, DOI 10.1109/TEST.1996.556969

[10]

McLaurin TL, 2003, INT TEST CONF P, P773, DOI 10.1109/TEST.2003.1270907

← 1 2 3 →