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- [23] Pore opening process and its influence on conductivity measurements of irradiated polymer films by application of the electrochemical etching method Radiation Measurements, 25 (1-4):
- [24] 2D-DEVICE SIMULATION WITH DEEP TRAP MODEL AND ITS APPLICATION TO COMPOUND SEMICONDUCTOR-DEVICE ANALYSES NEC RESEARCH & DEVELOPMENT, 1992, 33 (03): : 494 - 500
- [25] Optical emission spectrometry of plasma in low-damage sub-100 nm tungsten gate reactive ion etching process for compound semiconductor transistors Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (10 B): : 8364 - 8369
- [26] Optical emission spectrometry of plasma in low-damage sub-100nm tungsten gate reactive ion etching process for compound semiconductor transistors JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (10B): : 8364 - 8369