Simple Classification Using Binary Data

被引:0
作者
Needell, Deanna [1 ]
Saab, Rayan [2 ]
Woolf, Tina [3 ]
机构
[1] Univ Calif Los Angeles, Dept Math, 520 Portola Plaza, Los Angeles, CA 90095 USA
[2] Univ Calif, Dept Math, 9500 Gilman Dr, La Jolla, CA 92093 USA
[3] Claremont Grad Univ, Inst Math Sci, 150 E 10th St, Claremont, CA 91711 USA
关键词
binary measurements; one-bit representations; classification; JOHNSON-LINDENSTRAUSS; SIGNAL RECOVERY; NEURAL-NETWORKS; RECONSTRUCTION; EMBEDDINGS;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Binary, or one-bit, representations of data arise naturally in many applications, and are appealing in both hardware implementations and algorithm design. In this work, we study the problem of data classification from binary data obtained from the sign pattern of low-dimensional projections and propose a framework with low computation and resource costs. We illustrate the utility of the proposed approach through stylized and realistic numerical experiments, and provide a theoretical analysis for a simple case. We hope that our framework and analysis will serve as a foundation for studying similar types of approaches.
引用
收藏
页数:30
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