Electric current-assisted direct joining of silicon carbide

被引:19
作者
Li, Huaxin [1 ,2 ]
Koyanagi, Takaaki [3 ]
Ang, Caen [4 ]
Katoh, Yutai [3 ]
机构
[1] Zhejiang Univ Technol, Hangzhou 310014, Peoples R China
[2] Hefei Univ Technol, Hefei 230009, Peoples R China
[3] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
[4] Univ Tennessee, Knoxville, TN 37996 USA
关键词
Silicon carbide; Electric current assisted joining; Diffusion bonding; SINGLE-CRYSTAL GROWTH; SIC COMPOSITES; PLASMA; CERAMICS; CONTACT; JOINTS; DEGRADATION; PERFORMANCE; DIFFUSION; THICKNESS;
D O I
10.1016/j.jeurceramsoc.2020.05.072
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Conventional direct joining technologies are difficult to use with silicon carbide (SiC) materials, especially for fiber composite forms of SiC, because of the harsh conditions required. To reduce the temperature and/or process time required for the direct joining process, an electric current-assisted joining (ECAJ) method was studied. Joining of low-resistivity grade, nitrogen doped beta-SiC was demonstrated at a relatively low nominal temperature of 1750 degrees C with a 10 min hold by enhancing the passage of current through the material. The joining mechanism is discussed in terms of localized overheating and accelerated self-diffusion at the interface. In the case of joining at 2160 degrees C for 1 min, rapid crystal growth of textured SiC was found at the interface. This study indicates that rapid ECAJ-based direct joining is a practical and appropriate method for joining SiC-based materials.
引用
收藏
页码:3072 / 3081
页数:10
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