Some studies on structural and optical properties of ZnxCd1-xSe thin films

被引：9

作者：

Ammar, AH ^{[1
]}

机构：

[1] Ain Shams Univ, Fac Educ, Dept Phys, Cairo, Egypt

来源：

VACUUM | 2001年 / 60卷 / 03期

关键词：

ZnxCd1-xSe; thin films; optical constants; electron effective mass;

D O I：

10.1016/S0042-207X(00)00424-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin ZnxCd1-xSe films with a thickness ranging from 100 to 300 nm are prepared by thermal evaporation under a vacuum of 4.0 x 10(-4) Pa. Films deposited at substrate temperatures ranging from 570 to 625 K were found to be of polycrystalline nature, with sphalerite structure for x greater than or equal to 0.6 and wurtzite structure for x < 0.6. The optical constants n and k of ZnxCd1-xSe thin films of different composition were determined in the spectral range 400 - 2000 nm. The analysis of the accuracy of the adopted technique gave +/- 1.0 and +/- 0.5% for the real part of the refractive index it and the extinction coefficient k, respectively. Th band gap showed a non-linear variation with the value of x. The effective masses of the carriers and the band gap bowing parameters of ZnxCd1-xSe thin films were estimated. (C) 2001 Published by Elsevier Science Ltd.

引用

页码：355 / 360

页数：6

共 19 条

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