X-ray structural analysis of surface layers (Review)

被引：0
作者：
Ivanov, AN [1 ]
Yagodkin, YD [1 ]
机构：
[1] Moscow State Inst Steel & Alloys, Moscow, Russia
来源：
INDUSTRIAL LABORATORY | 2000年 / 66卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The use of the x-ray diffractometry with Bragg - Brentano focusing and grazing-angle techniques in the study of surface (mainly polycrystalline) layers is reviewed. Techniques for determination of the effective thickness of the absorbing layer, geometric-aberration effects due to defocusing, and analysis of fine crystal structure parameters (including nondestructive depth profiling) are discussed. Issues concerned with determination of the phase composition, macrostresses, and average grain size in the surface layer are considered. X-ray diffraction methods for nondestructive evaluation of overlayers and films are described.
引用
收藏
页码：304 / 314
页数：11
相关论文
共 50 条
[31]   Depth-resolving structural analysis of GaN layers by skew angle x-ray diffraction [J].
Reiher, A ;
Bläsing, J ;
Dadgar, A ;
Krost, A .
APPLIED PHYSICS LETTERS, 2004, 84 (18) :3537-3539
[32]   X-ray structural analysis of human serum [J].
Gagalska, J ;
Mikusinska-Planner, A .
PHYSICS AND CHEMISTRY OF LIQUIDS, 2003, 41 (01) :33-37
[33]   X-ray structural analysis of large biomolecules [J].
Muller, YA ;
Heinemann, U .
CHEMIE IN UNSERER ZEIT, 1998, 32 (01) :22-33
[34]   X-ray structural analysis of Donbass coals [J].
Pashchenko, L.V. ;
Saranchuk, V.I. ;
Kovalev, E.K. ;
Krypina, L.M. .
Khimiya Tverdogo Topliva, 1992, (02) :9-15
[35]   X-ray crystal structural analysis of dicyclohexylthiocarbamide [J].
Gao, Peng ;
Gao, Wei .
MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2016, 624 (01) :246-250
[36]   X-RAY STRUCTURAL-ANALYSIS OF MICROTUBULES [J].
MANDELKOW, E ;
THOMAS, J ;
COHEN, C .
HOPPE-SEYLERS ZEITSCHRIFT FUR PHYSIOLOGISCHE CHEMIE, 1977, 358 (03) :274-274
[37]   Structural diagnostics of 'quantum' layers by X-ray diffraction and standing waves [J].
Chuev, MA ;
Afanas'ev, AM ;
Imamov, RM ;
Mukhamedzhanov, EK ;
Pashaev, EM ;
Yakunin, SN .
MICRO- AND NANOELECTRONICS 2003, 2004, 5401 :543-554
[38]   Surface analysis of dental amalgams by X-ray photoelectron spectroscopy and X-ray diffraction [J].
Uo, M ;
Berglund, A ;
Cardenas, J ;
Pohl, L ;
Watari, F ;
Bergman, M ;
Sjöberg, S .
DENTAL MATERIALS, 2003, 19 (07) :639-644
[39]   SURFACE ANALYSIS WITH THE X-RAY PHOTOELECTRON SPECTROMETER [J].
STEINHARDT, RG ;
SERFASS, EJ .
ANALYTICAL CHEMISTRY, 1953, 25 (05) :697-700
[40]   Improved analysis of surface X-ray data [J].
Beneke, G ;
Schulz, H .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1997, 212 (12) :833-836
12345