Extended-range short-pulse interlayer tunneling spectroscopy for Bi2Sr2CaCu2O8+δ intrinsic Josephson junctions

被引:11
作者
Hamatani, T
Anagawa, K
Watanabe, T
Suzuki, M [1 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan
[2] NTT Corp, Photon Labs, Atsugi, Kanagawa 2430198, Japan
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2003年 / 390卷 / 02期
关键词
Bi2Sr2CaCu2O8-delta; interlayer tunneling spectroscopy; intrinsic Josephson junction; short-pulse;
D O I
10.1016/S0921-4534(02)02811-3
中图分类号
O59 [应用物理学];
学科分类号
摘要
The energy range for the short-pulse interlayer tunneling spectroscopy for Bi2Sr2CaCu2O2+delta has been extended from less than 100 meV per single junction to greater than 200 meV by adopting composite current pulses. This improvement eliminates the breakage of specimens during the measurements almost completely, leading to the observation of a likely doping-dependent dip-and-hump structure in the tunneling spectrum of Bi2Sr2CaCu2O8+delta. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:89 / 94
页数:6
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