Cryogenic Millimeter-Wave CMOS Low-Noise Amplifier

被引:0
作者
Varonen, Mikko [1 ]
Cleary, Kieran [2 ]
Karaca, Denizhan [3 ]
Halonen, Kari A. I. [3 ]
机构
[1] VTT Tech Res Ctr Finland, MilliLab, Espoo, Finland
[2] CALTECH, Cahill Radio Astron Lab, Pasadena, CA 91125 USA
[3] Aalto Univ, Espoo, Finland
来源
2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS | 2018年
基金
芬兰科学院;
关键词
CMOS; Cryogenic; low-noise amplifiers; MMIC;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we report a cryogenically cooled CMOS amplifier covering at least 75 to 115 GHz frequency range. The amplifier chip was fabricated in 28-nm FD SOI CMOS technology. When cryogenically cooled to 20 K and measured on-wafer the CMOS amplifier shows 108-155 K noise temperature from 75 to 115 GHz. This means 6 to 8 times improvement in noise temperature compared to room temperature noise. The measured small-signal gain is around 20 dB. To the best of authors' knowledge, these are the first cryogenic measurements of millimeter-wave CMOS amplifiers and lowest CMOS LNA noise temperatures for W-Band reported to date.
引用
收藏
页码:1503 / 1506
页数:4
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