Epitaxial properties of Co-doped ZnO thin films grown by plasma assisted molecular beam epitaxy

被引:0
作者
Cao Qiang [1 ]
Deng Jiang-Xia
Liu Guo-Lei
Chen Yan-Xue
Yan Shi-Shen
Mei Liang-Mo
机构
[1] Shandong Univ, Sch Phys & Microelect, Jinan 250100, Peoples R China
[2] Shandong Univ, Natl Key Lab Crystal Mat, Jinan 250100, Peoples R China
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中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
High quality Co-doped ZnO thin Elms are grown on single crystalline Al2O3(0001) and ZnO(0001) substrates by oxygen plasma assisted molecular beam epitaxy at a relatively lower substrate temperature of 450, C. The epitaxial conditions are examined with in-situ reflection high energy electron diffraction (RHEED) and ex-situ high resolution x-ray diffraction (HRXRD). The epitaxial thin Elms are single crystal at Elm thickness smaller than 500nm and nominal concentration of Co dopant up to 20%. It is indicated that the Co cation is incorporated into the ZnO matrix as CO2+ substituting Zn2+ ions. Atomic force microscopy shows smooth surfaces with rms roughness of 1.9nm. Room-temperature magnetization measurements reveal that the Co-doped ZnO thin Elms are ferromagnetic with Curie temperatures T-C above room temperature.
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页码:2951 / 2954
页数:4
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