An extended X-ray absorption fine structure study of Mn ultrathin films grown on Cu(100)

被引:10
|
作者
D'Addato, S
Finetti, P
机构
[1] Univ Modena, INFM, Dipartimento Fis, I-41100 Modena, Italy
[2] Queens Univ Belfast, Dept Phys, Belfast BT7 1NN, Antrim, North Ireland
关键词
extended X-ray absorption fine structure (EXAFS); growth; manganese; copper; metal-metal magnetic thin film structures;
D O I
10.1016/S0039-6028(00)00907-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Ultrathin Mn films grown at room temperature on Cu(1 0 0) have been studied with extended X-ray absorption fine structure (EXAFS) assisted by low energy electron diffraction (LEED). At a film coverage Theta = 0.5 monolayers (ML), corresponding to the presence of a c(2 x 2) superstructure in the LEED pattern, we obtained values of the bond length and of the effective coordination number which are consistent with the formation of a surface MnCu alloy, in agreement with previously published results. At increasing coverage the degradation of the LEED pattern with the disappearence of the spots at Theta = 6 ML and the absence of a clear multishell signal in the EXAFS results point towards a progressive decrease of long-range crystal order, probably caused by the strain of Mn films growing in a strongly distorted lattice. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:203 / 208
页数:6
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