Work function of MgO single crystals from ion-induced secondary electron emission coefficient

被引:77
作者
Lim, JY [1 ]
Oh, JS
Ko, BD
Cho, JW
Kang, SO
Cho, G
Uhm, HS
Choi, EH
机构
[1] Kwangwoon Univ, Dept Electrophys, PDP Res Ctr, Charged Particle Beam & Plasma Lab, Seoul 139701, South Korea
[2] Ajou Univ, Dept Mol Sci & Technol, Suwon 442749, South Korea
关键词
D O I
10.1063/1.1581376
中图分类号
O59 [应用物理学];
学科分类号
摘要
The work functions phi(omega) of MgO single crystals with its respective orientation (111), (200), and (220) have been investigated from their ion-induced secondary electron emission coefficient gamma, respectively, using various ions with different ionization energies in a gamma-focused ion beam system. The work function phi(omega) for MgO single crystal with (111) orientation has the lowest value, 4.22 eV, whereas it is 4.94 eV for (200) and the highest value is 5.07 eV for (220). These work functions of MgO single crystals can explain the nonzero values of the ion-induced secondary electron emission coefficient gamma for Xe+ ions, whose ionization energy is 12.13 eV. (C) 2003 American Institute of Physics.
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收藏
页码:764 / 769
页数:6
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