An extraction algorithm for core-level excitations in non-resonant inelastic X-ray scattering spectra

被引：45

作者：

Sternemann, H. ^{[1
]}

Sternemann, C. ^{[1
]}

Seidler, G. T. ^{[2
]}

Fister, T. T. ^{[2
]}

Sakko, A. ^{[3
]}

Tolan, M. ^{[1
]}

机构：

[1] Univ Dortmund, Fak Phys DELTA, D-44221 Dortmund, Germany

[2] Univ Washington, Dept Phys, Seattle, WA 98195 USA

[3] Univ Helsinki, Dept Phys Sci, Helsinki, Finland

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2008年 / 15卷 / 02期

关键词：

non-resonant inelastic X-ray scattering; core-level excitations; Compton scattering; X-ray absorption; silicon;

D O I：

10.1107/S0909049508001696

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Non-resonant inelastic X-ray scattering of core electrons is a prominent tool for studying site-selective, i.e. momentum-transfer-dependent, shallow absorption edges of liquids and samples under extreme conditions. A bottleneck of the analysis of such spectra is the appropriate subtraction of the underlying background owing to valence and core electron excitations. This background exhibits a strong momentum-transfer dependence ranging from plasmon and particle-hole pair excitations to Compton scattering of core and valence electrons. In this work an algorithm to extract the absorption edges of interest from the superimposed background for a wide range of momentum transfers is presented and discussed for two examples, silicon and the compound silicondioxide. (C) 2008 International Union of Crystallography.

引用

页码：162 / 169

页数：8

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