A 50% duty-cycle correction circuit for PLL output

被引:0
作者
Ogawa, T [1 ]
Taniguchi, K [1 ]
机构
[1] Osaka Univ, Dept Elect & Informat Syst, Suita, Osaka 5650871, Japan
来源
2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL IV, PROCEEDINGS | 2002年
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A 50% duty-cycle correction circuit was proposed to tighten duty-cycle into an allowable range to increase the yield of PLLs designed with deep submicron design rules. The circuit composed of duty-detection and duty-correction sub-circuits reduces the duty-cycle fluctuation of PLLs originating from the mismatches of devices and transient responses in signal paths. The 50% duty-cycle correction circuit fabricated with a 0.6mum design rule demonstrated that all the input signals in the range of duty-cycle from 20 to 80% turn out to be duty-cycle fluctuation of 0.21% at the output, achieving one-three hundreds of reduction of duty-cycle fluctuation.
引用
收藏
页码:21 / 24
页数:4
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