Characterization of UFG materials by X-ray and Neutron diffraction

被引:2
|
作者
Ungar, T. [1 ]
Ribarik, G.
机构
[1] Eotvos Lorand Univ, Dept Mat Phys, H-1117 Budapest, Hungary
关键词
LINE-PROFILE ANALYSIS; SEVERE PLASTIC-DEFORMATION; CRYSTALLITE SIZE; MICROSTRUCTURAL EVOLUTION; DISLOCATION-STRUCTURE; DEFORMED COPPER; FLOW-STRESS; GRAIN-SIZE; STAGE-IV; STACKING;
D O I
10.1088/1757-899X/194/1/012003
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Grain size, subgrain size, microstrain, dislocation density and dislocation types and intergranular strains determine the mechanical, chemical and other physical properties in materials of submicron grain size. Electron microscopy is a straightforward method to determine the substructure. X-ray and neutron diffraction methods supplement dynamic properties, especially strains and stresses and number densities of substructure elements. The synergy of electron microscopy and diffraction patterns provides a more comprehensive characterization of the substructure and a better understanding of the performance of ultra-fine-grain (UFG) materials.
引用
收藏
页数:8
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