Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers

被引：26

作者：

Gonzalez-Rovira, L. ^{[1
]}

Lopez-Haro, M. ^{[1
]}

Hungria, A. B. ^{[1
]}

El Amrani, K. ^{[1
]}

Sanchez-Amaya, J. M. ^{[2
]}

Calvino, J. J. ^{[1
]}

Botana, F. J. ^{[1
]}

机构：

[1] Univ Cadiz, Dept Mat Sci & Met Engn & Inorgan Chem, Cadiz 11510, Spain

[2] Titania Ensayos & Proyectos Ind, SL Parque Tecnobahia, El Puerto Santa Maria 11500, Cadiz, Spain

来源：

CORROSION SCIENCE | 2010年 / 52卷 / 11期

关键词：

Aluminium; SEM; STEM; Anodic films; POROUS ALUMINA; CELL-WALLS; FILMS; FABRICATION; TRACER; ARRAYS;

D O I：

10.1016/j.corsci.2010.07.027

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acids have been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM and STEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers. Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features of the spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentration of P-species occurs, approximately, at the middle of the pore wall: adjacent to the pore for C-species, whereas the distribution of S-species appears to be uniform. (C) 2010 Elsevier Ltd. All rights reserved.

引用

页码：3763 / 3773

页数：11

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