Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers

被引:26
作者
Gonzalez-Rovira, L. [1 ]
Lopez-Haro, M. [1 ]
Hungria, A. B. [1 ]
El Amrani, K. [1 ]
Sanchez-Amaya, J. M. [2 ]
Calvino, J. J. [1 ]
Botana, F. J. [1 ]
机构
[1] Univ Cadiz, Dept Mat Sci & Met Engn & Inorgan Chem, Cadiz 11510, Spain
[2] Titania Ensayos & Proyectos Ind, SL Parque Tecnobahia, El Puerto Santa Maria 11500, Cadiz, Spain
关键词
Aluminium; SEM; STEM; Anodic films; POROUS ALUMINA; CELL-WALLS; FILMS; FABRICATION; TRACER; ARRAYS;
D O I
10.1016/j.corsci.2010.07.027
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acids have been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM and STEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers. Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features of the spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentration of P-species occurs, approximately, at the middle of the pore wall: adjacent to the pore for C-species, whereas the distribution of S-species appears to be uniform. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:3763 / 3773
页数:11
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