Total dose and dose rate response of an AD590 temperature transducer

被引：33
作者：
Pease, Ronald L. [1 ]
Dunham, Gary W.
Seiler, John E.
Platteter, Dale G.
McClure, Steven S.
机构：
[1] RLP Res, Los Lunas, NM 87031 USA
[2] NAVSEA Crane, Crane, IN 47522 USA
[3] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 04期
关键词：
dose rate; enhanced low-dose-rate sensitivity; radiation effects; temperature transducer; total ionizing dose;
D O I：
10.1109/TNS.2007.892262
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The total dose response of the Analog Devices AD590 is presented for a variety of irradiation test conditions. The parts packaged in flat-packs show very large enhanced low dose rate sensitive (ELDRS) response for unbiased irradiation, starting at about 20 krad, whereas parts packaged in TO-52 cans are not ELDRS. The reason for this package sensitivity appears to be a result of hydrogen trapped in the cavity of the flat-pack package. The responses at 10 mrad/s and 3 mrad/s are essentially the same, indicating that the low dose rate enhancement factor has leveled off below 10 mrad/s. Elevated temperature irradiation at 100 degrees C and 5 rad/s does not simulate the low dose rate response.
引用
收藏
页码：1049 / 1054
页数：6
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