Synthesis and characterization of (Cd, Zn) S buffer layer for Cu2ZnSnSe4 solar cells

被引:11
|
作者
Ben Messaoud, Khaled [1 ,4 ,7 ]
Buffiere, Marie [4 ,6 ,8 ]
Brammertz, Guy [2 ,3 ]
Lenaers, Nick [2 ,5 ]
Boyen, Hans-Gerd [2 ,3 ]
Sahayaraj, Sylvester [4 ,6 ]
Meuris, Marc [2 ,3 ]
Amlouk, Mosbah [7 ]
Poortmans, Jef [3 ,4 ,6 ]
机构
[1] King Abdulaziz City Sci & Technol, King Abullah Rd 6086, Riyadh 11442, Saudi Arabia
[2] Imec Div IMOMEC Partner Solliance, Wetenschapspk 1, B-3590 Diepenbeek, Belgium
[3] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium
[4] Imec Partner Solliance, Kapeldreef 75, B-3001 Leuven, Belgium
[5] Katholieke Univ Leuven, Dept Mat Engn MTM, B-3001 Heverlee, Belgium
[6] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Heverlee, Belgium
[7] El Manar Univ, Unite Phys Dispositifs Semicond, Fac Sci Tunis, El Manar 2092, Tunisia
[8] Qatar Fdn, Qatar Environm & Energy Res Inst, Doha, Qatar
关键词
thin film; solar cells; Cu2ZnSnSe4; (Cd; Zn)S buffer layers; carrier recombination; THIN-FILMS; INTERFACE; MODULES;
D O I
10.1088/1361-6463/aa76b7
中图分类号
O59 [应用物理学];
学科分类号
摘要
In order to improve the electrical performances of Cu2ZnSnSe4 (CZTSe) based solar cells, the standard CdS buffer layer was replaced by (Cd, Zn) S processed by chemical bath deposition. The morphology and composition of the (Cd, Zn) S thin films were studied as a function of [Zn]/([Zn] + [Cd]) ratio in the chemical bath (80, 85 and 90%). The CZTSe/(Cd, Zn) S solar cells with and without Cd partial electrolyte (Cd PE) treatment were compared to CZTSe/ CdS reference devices using current-voltage and external quantum efficiency measurements. The (Cd, Zn) S thin films show a non-homogeneity of Zn distribution and phase formation, with a shift from Zn(O, OH)(x) to ZnS phase when increasing the deposition time and a decrease of the layers thicknesses when increasing the Zn concentration in chemical bath. A model for the growth of (Cd, Zn) S thin films is proposed. The resulting CZTSe/(Cd, Zn) S devices show an important reduction of the barrier at the hetero-interface, which is attributed to the lower density of O contamination in (Cd, Zn) S compared to CdS, inducing a lower density of deep p-type recombination centers. Despite the reduced compensation of the buffer layer, CZTSe/ (Cd, Zn) S devices show a deterioration of the open circuit voltage and the fill factor with the increase of Zn content in (Cd, Zn) S. These electrical losses were avoided by Cd PE treatment prior to the deposition of (Cd, Zn) S.
引用
收藏
页数:12
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