Revealing the flexoelectricity in the mixed-phase regions of epitaxial BiFeO3 thin films

被引：31

作者：

Cheng, Cheng-En ^{[1
,2
,3
]}

Liu, Heng-Jui ^{[4
]}

Dinelli, Franco ^{[5
]}

Chen, Yi-Chun ^{[6
]}

Chang, Chen-Shiung ^{[1
,2
]}

Chien, Forest Shih-Sen ^{[3
]}

Chu, Ying-Hao ^{[4
]}

机构：

[1] Natl Chiao Tung Univ, Dept Photon, Hsinchu 30010, Taiwan

[2] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu 30010, Taiwan

[3] Tunghai Univ, Dept Appl Phys, Taichung 40704, Taiwan

[4] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 30010, Taiwan

[5] CNR, Ist Nazl Ott, I-56124 Pisa, Italy

[6] Natl Cheng Kung Univ, Dept Phys, Tainan 701, Taiwan

来源：

SCIENTIFIC REPORTS | 2015年 / 5卷

关键词：

ELECTROMECHANICAL RESPONSE; NANOSCALE; POLARIZATION; MAGNETISM; MECHANISM; STRAIN;

D O I：

10.1038/srep08091

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Understanding the elastic response on the nanoscale phase boundaries of multiferroics is an essential issue in order to explain their exotic behaviour. Mixed-phase BiFeO3 films, epitaxially grown on LaAlO3 (001) substrates, have been investigated by means of scanning probe microscopy to characterize the elastic and piezoelectric responses in the mixed-phase region of rhombohedral-like monoclinic (M-I) and tilted tetragonal-like monoclinic (M-II,M-tilt) phases. Ultrasonic force microscopy reveal that the regions with low/ high stiffness values topologically coincide with the M-I/M-II,M-tilt phases. X-ray diffraction strain analysis confirms that the M-I phase is more compliant than the M-II,(tilt) one. Significantly, the correlation between elastic modulation and piezoresponse across the mixed-phase regions manifests that the flexoelectric effect results in the enhancement of the piezoresponse at the phase boundaries and in the M-I regions. This accounts for the giant electromechanical effect in strained mixed-phase BiFeO3 films.

引用

页数：5

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