InAlAs/InGaAs metamorphic high electron mobility transistors on GaAs substrate: Influence of indium content on material properties and device performance

被引:32
作者
Cordier, Y
Bollaert, S
Zaknoune, M
Dipersio, J
Ferre, D
机构
[1] Univ Sci & Technol Lille, Inst Elect & Microelet Nord, CNRS, UMR 9929, F-59652 Villeneuve Dascq, France
[2] Univ Sci & Technol Lille, LSPES, URA 234, Lille, France
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1999年 / 38卷 / 2B期
关键词
molecular beam epitaxy; InAlAs/InGaAs on GaAs; lattice mismatch; high electron mobility transistor; Hall effect; atomic force microscopy; Schottky contacts; DC and AC characteristics;
D O I
10.1143/JJAP.38.1164
中图分类号
O59 [应用物理学];
学科分类号
摘要
The development of lattice mismatched InAlAs/InGaAs high electron mobility transistors on high-quality GaAs substrates (metamorphic HEMT) is of primary interest for millimeter-wave devices. These heterostructures grown on lattice mismatched substrates allow an extension of the composition range in the structures and to exploit enhanced properties, provided that the crystalline perfection of the layers as well as electrical quality are preserved. The aim of this work is to study the influence of indium mole fraction on material properties as well as its consequences on device performance.
引用
收藏
页码:1164 / 1168
页数:5
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