Longevity of organic light-emitting devices by means of polyacrylate passivation layers formed by using spin coating method

被引：1

作者：

Kim, GH ^{[1
]}

Oh, JY ^{[1
]}

Yang, YS ^{[1
]}

Lee, JI ^{[1
]}

Do, LM ^{[1
]}

Zyung, T ^{[1
]}

机构：

[1] Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

来源：

MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2003年 / 405卷

关键词：

encapsulation; life time; passivation layer; polyacrylate;

D O I：

10.1080/15421400390264171

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We fabricate organic light-emitting devices with polyacrylate passivation layers formed by using spin coating method and compare the rate of degradation to an organic light-emitting device without the passivation layer. The fabrication process of passivation layer did not influence the electrical and the emissive properties of the device. Polyacrylate passivation layers enhanced the longevity of the device than that of the non-encapsulated device, and its behavior was dependent on the polyacrylate film thickness.

引用

页码：75 / 81

页数：7

共 15 条

[1]

AFFINITO JD, 1997, THIN SOLID FILMS, V19, P308

[2] Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes [J].

Aziz, H ;

Popovic, Z ;

Tripp, CP ;

Hu, NX ;

Hor, AM ;

Xu, G .

APPLIED PHYSICS LETTERS, 1998, 72 (21) :2642-2644

[3] RELIABILITY AND DEGRADATION OF ORGANIC LIGHT-EMITTING DEVICES [J].

BURROWS, PE ;

BULOVIC, V ;

FORREST, SR ;

SAPOCHAK, LS ;

MCCARTY, DM ;

THOMPSON, ME .

APPLIED PHYSICS LETTERS, 1994, 65 (23) :2922-2924

[4] Ultra barrier flexible substrates for flat panel displays [J].

Burrows, PE ;

Graff, GL ;

Gross, ME ;

Martin, PM ;

Shi, MK ;

Hall, M ;

Mast, E ;

Bonham, C ;

Bennett, W ;

Sullivan, MB .

DISPLAYS, 2001, 22 (02) :65-69

[5] In situ characterization of the oxidative degradation of a polymeric light emitting device [J].

Cumpston, B.H. ;

Parker, I.D. ;

Jensen, K.F. .

1997, American Inst of Physics, Woodbury, NY, United States (81)

[6] In situ investigation of degradation in polymeric electroluminescent devices using time-resolved confocal laser scanning microscope [J].

Do, LM ;

Kim, KJ ;

Zyung, T ;

Shim, HK ;

Kim, JJ .

APPLIED PHYSICS LETTERS, 1997, 70 (25) :3470-3472

[7] Surface roughness effects and their influence on the degradation of organic light emitting devices [J].

Jonda, C ;

Mayer, ABR ;

Stolz, U ;

Elschner, A ;

Karbach, A .

JOURNAL OF MATERIALS SCIENCE, 2000, 35 (22) :5645-5651

[8] Direct observation of structural changes in organic light emitting devices during degradation [J].

Kolosov, D ;

English, DS ;

Bulovic, V ;

Barbara, PF ;

Forrest, SR ;

Thompson, ME .

JOURNAL OF APPLIED PHYSICS, 2001, 90 (07) :3242-3247

[9]

Kwon SH, 2001, APPL PHYS LETT, V79, P4450, DOI 10.1063/1.1428770

[10] Influence of electrical stress voltage on cathode degradation of organic light-emitting devices [J].

Lin, KK ;

Chua, SJ ;

Lim, SF .

JOURNAL OF APPLIED PHYSICS, 2001, 90 (02) :976-979

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