Chalcogenide coatings of Ge15Sb20S65 and Te20As30Se50

被引:38
作者
Nazabal, Virginie [1 ]
Cathelinaud, Michel [2 ]
Shen, Weidong [2 ]
Nemec, Petr [3 ]
Charpentier, Frederic [1 ]
Lhermite, Herve [4 ]
Anne, Marie-Laure [1 ]
Capoulade, Jeremie [2 ]
Grasset, Fabien [1 ]
Moreac, Alain [5 ]
Inoue, Satoru [6 ]
Frumar, Miloslav [3 ]
Adam, Jean-Luc [1 ]
Lequime, Michel [2 ]
Amra, Claude [2 ]
机构
[1] Univ Rennes 1, UMR 6226, F-35042 Rennes, France
[2] Univ Aix Marseille 1, Univ Paul Cezanne Aix Marseille, Ecole Cent Marseille, Inst Fresnel,CNRS,UMR 6133, F-13397 Marseille, France
[3] Univ Pardubice, Fac Chem Technol, Dept Gen & Inorgan Chem, Pardubice 53210, Czech Republic
[4] Univ Rennes 1, Inst Elect & Telecommun Rennes Microelect, F-35042 Rennes, France
[5] Univ Rennes 1, Grp Matiere Condensee & Mat, UMR 6626, F-35042 Rennes, France
[6] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050041, Japan
关键词
D O I
10.1364/AO.47.00C114
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Chalcogenide coatings are investigated to obtain either optical components for spectral applications or optochemical sensors in the mid-infrared. The deposition of Ge15Sb20S65 and Te20As30Se50 chalcogenide glasses is performed by two physical techniques: electron-beam and pulsed-laser deposition. The quality of the film is analyzed by scanning electron microscopy, atomic force microscopy, and energy dispersive spectroscopy to characterize the morphology, topography, and chemical composition. The optical properties and optical constants are also determined. A CF4 dry etching is performed on these films to obtain a channeled optical waveguide. For a passband filter made by electron-beam deposition, cryolite as a low-refractive-index material and chalcogenide glasses as high-refractive-index materials are used to favor a large refractive-index contrast. A shift of a centered wavelength of a photosensitive passband filter is controlled by illumination time. (C) 2008 Optical Society of America.
引用
收藏
页码:C114 / C123
页数:10
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