Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications

被引：7
作者：
Kappen, P
Tröger, L
Hansen, K
Reckleben, C
Lechner, P
Strssüder, L
Materlik, G
机构：
[1] DESY, HASYLAB, D-22607 Hamburg, Germany
[2] FEC, DESY, D-22607 Hamburg, Germany
[3] KETEK GmbH, D-85764 Oberschleissheim, Germany
[4] MPI Halbleiterlab, D-81739 Munich, Germany
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷
关键词：
silicon-drift-detector; multi-element detector characterization; X-ray spectroscopy; local performance; peak to background ratio;
D O I：
10.1016/S0168-9002(01)00586-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Spatially resolved spectroscopic measurements with a 10 and 20 mum pencil beam have been performed on a monolithic 7-element Silicon-Drift-Detector (SDD). Detailed studies are shown of the modification of the spectroscopic response at pixel edges and pixel centre. The results give quantitative insight into the local SDD performance. A simple model predicts global properties (e.g. peak-to-background ratio) of larger SDD arrays, like the 61-element detector currently under development. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：1163 / 1166
页数：4
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