Modulation Z-scan technique for characterization of photorefractive crystals

被引：5
|
作者：
Aguilar, PAM [1 ]
Mondragon, JJS [1 ]
Stepanov, S [1 ]
机构：
[1] INST NACL ASTROFIS OPT & ELECT, PUEBLA 72000, MEXICO
来源：
OPTICS LETTERS | 1996年 / 21卷 / 19期
关键词：
D O I：
10.1364/OL.21.001541
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We propose a simple single-beam configuration for characterization of the amplitude, speed of growth, and polarization properties of the photoinduced refractive-index change that is due to a drift photorefractive mechanism of nonlinearity in crystals, namely, the modulation Z-scan technique, based on the modulation of an externally applied electric field. The results of a simple theoretical model developed for one-dimensional parabolic photorefractive lens formation in this configuration are illustrated by original experiments with a semi-insulating GaAs crystal at lambda = 1.06 mu m. (C) 1996 Optical Society of America
引用
收藏
页码：1541 / 1543
页数：3
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