X-ray radiation shielding of CeO2 doped borosilicate glasses and their luminescence characteristics

The novel shielding materials from (55-x) SiO2: 13B2O3: 1Al2O3: 4.5BaO: 6.3CaO: 0.2Sb2O3: 20Na2O: xCeO2 where x = 1, 2, 3, 4 and 5 mol% glasses have been fabricated at different CeO2 concentration by melt-quenching technique and studied the luminescence and radiation shielding properties. The transmission spectra show redshift in UV range, due to higher Ce concentration in the glass matrix. The emission bands of glasses around 393 nm were observed from the 5d-4f transition of an electron in the Ce3+ ion. In the present glass matrix doped with CeO2 shows oxidation state of both Ce3+ and Ce4+. Decay curves are also investigated and found to be less than 100 ns. The X-rays shielding properties such as half-value layer (HVL), tenth value layer (TVL), mean free path (MFP), and linear attenuation coefficients (mu) of glass were investigated. The HVL values of glass samples at 5 mol% has better shielding behavior than commercial x-ray windows. The obtained results from the measurements suggests that these glasses are potential host for radiation shielding material application and also UV emitting device applications.