Dielectric properties of columnar-grained (Ba0.75Sr0.25)(Zr0.25Ti 0.75)O3 thin films prepared by pulsed laser deposition

被引:19
作者
Tang, XG
Wang, J
Chan, HLW
机构
[1] Guangdong Univ Technol, Fac Appl Phys, Guangzhou 510090, Peoples R China
[2] Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
[3] Hong Kong Polytech Univ, Mat Res Ctr, Kowloon, Hong Kong, Peoples R China
关键词
characterization; (Ba; Sr)(Zr; Ti)O-3; dielectric materials; laser epitaxy;
D O I
10.1016/j.jcrysgro.2004.11.389
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The preferentially (100)-oriented (Ba0.75Sr0.25)(Zr0.25Ti0.75)O-3 (BSZT) thin films were deposited on Pt(111)/Ti/SiO2/ Si(I 0 0) substrates by a pulsed laser deposition process. The films exhibited columnar-grained characteristics with grain sizes of 30-80 nm. The temperature dependence of dielectric constants was investigated; it is shown that the cubic to rhombohedral phase transition temperature is located at the vicinity of 200 K. At 300 K and 1 MHz, the dielectric constant and loss tan 6 are 321 and 0.014, respectively. The dielectric constant of BSZT film changes significantly with applied DC bias field and has a high tunability of similar to 53% at 1 MHz and an applied field of 600kV/cm. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:453 / 457
页数:5
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