Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise

被引:0
作者
Mathur, Aashish [1 ]
Bhatnagar, Manav R. [1 ]
Panigrahi, Bijaya K. [1 ]
机构
[1] Indian Inst Technol Delhi, Dept Elect Engn, Hauz Khas, New Delhi 110016, India
来源
2015 IEEE 82ND VEHICULAR TECHNOLOGY CONFERENCE (VTC FALL) | 2015年
关键词
Background noise; binary phase shift keying; Nakagami-m distribution; outage probability; power line communications; Rician fading; POWER-LINE COMMUNICATIONS; PERFORMANCE ANALYSIS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Power line communication (PLC) deals with the transmission of data through the use of power lines. It is an emerging field of communication for the home area network of smart grid. The presence of the additive and multiplicative power line noises significantly affects the performance of PLC systems. There are two types of additive noises in PLC systems, namely background noise and impulsive noise. The multiplicative PLC noise results in fading in the received signal strength. The Rician fading model has been experimentally found to be applicable to the PLC systems and has been widely used in conventional and current literature on PLC. In this paper, we provide the performance analysis of a PLC system over Rician fading channel under Nakagami-m distributed additive background noise assuming binary phase shift keying modulation scheme. We derive the probability density function of the decision variable and the instantaneous signal-to-noise ratio (SNR). A closed-form expression of the outage probability of the considered system is obtained. The validity of the derived analytical expressions is closely verified by the simulated results.
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页数:7
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