Study of micropipe structure in SiC by x-ray phase contrast imaging

被引：29

作者：

Kohn, V. G.

Argunova, T. S.

Je, Jung Ho ^{[1
]}

机构：

[1] IV Kurchatov Atom Energy Inst, Russian Res Ctr, Moscow 123182, Russia

[2] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia

[3] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Xray Imaging Ctr, Pohang 790784, South Korea

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 17期

基金：

俄罗斯基础研究基金会;

关键词：

D O I：

10.1063/1.2801355

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Phase contrast images of dislocation micropipe in SiC crystal are experimentally studied at various distances from the sample using synchrotron white beam. Computer simulation of these images enabled us to understand the peculiarities of image formation and measure the diameter of the micropipe. The phase contrast imaging of micropipes without monochromator is explained by the absorption of x rays in a thick (490 mu m) SiC crystal, effectively forming a high brilliance radiation spectrum with a pronounced maximum at 16 keV. (C) 2007 American Institute of Physics.

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页数：3

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