共 23 条
[1]
[Anonymous], 2014, TOYOTA GLOBAL NEWSRO
[2]
Characterization of Diverse Gate Oxides on 4H-SiC 3D Trench-MOS Structures
[J].
SILICON CARBIDE AND RELATED MATERIALS 2012,
2013, 740-742
:691-+
[3]
Reliability Aspects of High Voltage 4H-SiC JBS Diodes
[J].
SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2,
2009, 600-603
:935-+
[4]
The Impact of Schottky Barrier Tunneling on SiC-JBS Performance
[J].
SILICON CARBIDE AND RELATED MATERIALS 2008,
2009, 615-617
:667-670
[5]
Fujibayashi H., 2013, INT C SIL CARB REL M, P108
[6]
Impact of Surface Morphology above Threading Dislocations on Leakage Current in 4H-SiC Diodes
[J].
SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2,
2012, 717-720
:911-+
[9]
Present status and future prospects for electronics in electric vehicles/hybrid electric vehicles and expectations for wide-bandgap semiconductor devices
[J].
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS,
2008, 245 (07)
:1223-1231
[10]
Present Status and Future Prospects for Electronics in EVs/HEVs and Expectations for Wide Bandgap Semiconductor Devices
[J].
SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2,
2009, 600-603
:889-893