Cyclotron resonance at microwave frequencies in two-dimensional hole system in AlGaAs/GaAs quantum wells

被引：26
作者：
Pan, W
Lai, K
Bayrakci, SP
Ong, NP
Tsui, DC
Pfeiffer, LN
West, KW
机构：
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
[2] Princeton Univ, Dept Phys, Princeton, NJ 08544 USA
[3] Lucent Technol, Bell Labs, Murray Hill, NJ 07974 USA
来源：
APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 17期
关键词：
D O I：
10.1063/1.1623008
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Cyclotron resonance at the microwave frequency is used to measure the band edge mass (m(b)) in the two-dimensional hole (2DH) system, confined in 30 nm quantum wells in the Al0.1Ga0.9As/GaAs/Al0.1Ga0.9As heterostructures. We find that for 2DH density pless than or equal to1.0x10(10) cm(-2), m(b) is nearly constant, similar to0.35m(e). It increases with increasing density, to similar to0.5m(e) at p=7.4x10(10) cm(-2). (C) 2003 American Institute of Physics.
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页码：3519 / 3521
页数：3
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