Depth of formation of a reflected soft x-ray beam under conditions of specular reflection

被引：13

作者：

Filatova, EO ^{[1
]}

Shulakov, AS ^{[1
]}

Luk'yanov, VA ^{[1
]}

机构：

[1] St Petersburg State Univ, Inst Phys, St Petersburg 198904, Russia

来源：

PHYSICS OF THE SOLID STATE | 1998年 / 40卷 / 07期

基金：

俄罗斯基础研究基金会;

关键词：

Radiation; Spectroscopy; Reflection; Dioxide; State Physics;

D O I：

10.1134/1.1130529

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Over a wide range of glancing-incidence angles, bremsstrahlung from an x-ray tube was used to measure the reflection spectra of an Si-SiO2 system with different dioxide thickness near the Si L-2,L-3 ionization threshold. The angular dependence of the depth of formation of the reflected soft x-ray beam was determined experimentally and compared with that obtained from a theoretical analysis of the interaction between electromagnetic radiation and the surface of an isotropic solid. (C) 1998 American Institute of Physics.

引用

页码：1237 / 1240

页数：4

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