ON PROXIMITY-OBLIVIOUS TESTING

被引:30
作者
Goldreich, Oded [1 ]
Ron, Dana [2 ]
机构
[1] Weizmann Inst Sci, Dept Comp Sci, IL-76100 Rehovot, Israel
[2] Tel Aviv Univ, Sch Elect Engn, Ramat Aviv, Israel
基金
以色列科学基金会;
关键词
property testing; graph properties; PROPERTY;
D O I
10.1137/100789646
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
We initiate a systematic study of a special type of property testers. These testers consist of repeating a basic test for a number of times that depends on the proximity parameter, whereas the basic test is oblivious of the proximity parameter. We refer to such basic tests by the term proximity-oblivious testers. While proximity-oblivious testers were studied before-most notably in the algebraic setting-the current study seems to be the first one to focus on graph properties. We provide a mix of positive and negative results, and in particular characterizations of the graph properties that have constant-query proximity-oblivious testers in the two standard models (i.e., the adjacency matrix and the bounded-degree models). Furthermore, we show that constant-query proximity-oblivious testers do not exist for many easily testable properties, and that even when proximity-oblivious testers exist, repeating them does not necessarily yield the best standard testers for the corresponding property.
引用
收藏
页码:534 / 566
页数:33
相关论文
共 29 条
[1]  
Alon N., 2006, STOC'06. Proceedings of the 38th Annual ACM Symposium on Theory of Computing, P251
[2]   Testing of clustering [J].
Alon, N ;
Dar, S ;
Parnas, M ;
Ron, D .
SIAM JOURNAL ON DISCRETE MATHEMATICS, 2003, 16 (03) :393-417
[3]   Testing subgraphs in large graphs [J].
Alon, N .
RANDOM STRUCTURES & ALGORITHMS, 2002, 21 (3-4) :359-370
[4]   Testing κ-colorability [J].
Alon, N ;
Krivelevich, M .
SIAM JOURNAL ON DISCRETE MATHEMATICS, 2002, 15 (02) :211-227
[5]   Efficient testing of large graphs [J].
Alon, N ;
Fischer, E ;
Krivelevich, M ;
Szegedy, M .
COMBINATORICA, 2000, 20 (04) :451-476
[6]   A characterization of easily testable induced subgraphs [J].
Alon, Noga ;
Shapira, Asaf .
COMBINATORICS PROBABILITY & COMPUTING, 2006, 15 (06) :791-805
[7]   Linearity testing in characteristic two [J].
Bellare, M ;
Coppersmith, D ;
Hastad, J ;
Kiwi, M ;
Sudan, M .
IEEE TRANSACTIONS ON INFORMATION THEORY, 1996, 42 (06) :1781-1795
[8]   Some 3CNF properties are hard to test [J].
Ben-Sasson, E ;
Harsha, P ;
Raskhodnikova, S .
SIAM JOURNAL ON COMPUTING, 2005, 35 (01) :1-21
[9]  
Benjamini I, 2008, ACM S THEORY COMPUT, P393
[10]   SELF-TESTING CORRECTING WITH APPLICATIONS TO NUMERICAL PROBLEMS [J].
BLUM, M ;
LUBY, M ;
RUBINFELD, R .
JOURNAL OF COMPUTER AND SYSTEM SCIENCES, 1993, 47 (03) :549-595