Variation of the grand mean value of Si-O distances in metamorphic reactions

被引：0

作者：

Ye, DN ^{[1
]}

Li, Z ^{[1
]}

He, W ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Geol & Geophys, Beijing 100029, Peoples R China

来源：

CHINESE SCIENCE BULLETIN | 2001年 / 46卷 / 08期

关键词：

metamorphic reaction; Si-O distance; grand mean value;

D O I：

10.1007/BF03182841

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

The grand mean values of Si-O distances in both the left and the right sides of 33 metamorphic reaction equations have been calculated on the basis of data of single crystal structural refinement analysis. The results showed that the grand mean value of Si-O distances tends to decrease at high temperature, whereas that tends to increase at high pressure during a metamorphic reaction.

引用

页码：702 / 704

页数：3

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