SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

被引：9
|
作者：
Koga, R [1 ]
Crain, SH [1 ]
Yu, P [1 ]
Crawford, KB [1 ]
机构：
[1] Aerospace Corp, Los Angeles, CA 90009 USA
来源：
2000 IEEE RADIATION EFFECTS DATA WORKSHOP - WORKSHOP RECORD | 2000年
关键词：
D O I：
10.1109/REDW.2000.896268
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have devised ways to measure the SEE sensitivity of plastic-encapsulated, high-density DRAMs with the use of limited-range heavy ions. The sensitivity at low LET regions is verified using a few species of ions with a long range.
引用
收藏
页码：45 / 52
页数：8
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