Measurement of thin surface films on electrodes by ellipsometry

被引：0

作者：

Ohtsuka, T

机构：

来源：

ELECTROCHEMISTRY | 2001年 / 69卷 / 05期

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D O I：

10.5796/electrochemistry.69.357

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

[No abstract available]

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页码：357 / 361

页数：5

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