Flip-flop hardening for space applications

被引：8

作者：

Monnier, T ^{[1
]}

Roche, FM ^{[1
]}

Cathebras, G ^{[1
]}

机构：

[1] Univ Montpellier 2, Lab Informat Robot & Microelect Montpellier, UMR 9928, CNRS, F-34392 Montpellier 05, France

来源：

1998 INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING - PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/MTDT.1998.705955

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The purpose of this work is to design a Flip-flop hardened to Single Evens Upset (SEU) for space radiation environment. The design hardening technique is based on the use of two Dlatch hardened both to static and dynamic SEU by the concepts of high impedance state and nMOS feedback.

引用

页码：104 / 107

页数：4