Structural characterization of amorphized InP: Evidence for chemical disorder

被引:17
作者
Glover, CJ [1 ]
Ridgway, MC
Yu, KM
Foran, GJ
Lee, TW
Moon, Y
Yoon, E
机构
[1] Australian Natl Univ, Res Sch Phys Sci & Engn, Dept Elect Mat Engn, Canberra, ACT, Australia
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[3] Australian Nucl Sci & Technol Org, Menai, NSW 2234, Australia
[4] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul, South Korea
关键词
D O I
10.1063/1.123664
中图分类号
O59 [应用物理学];
学科分类号
摘要
Extended x-ray absorption fine-structure measurements at the In K edge of amorphous InP are presented. The presence of chemical disorder in the form of like-atom bonding has been unambiguously demonstrated in stoichiometric InP amorphized by ion implantation. In-In bonding comprised 14% +/- 4% of the In-atom constituent bonds. Also, relative to the crystalline value of four P atoms, an increase in the total In coordination number to 4.16+/-0.32 atoms was observed for the amorphous phase, as composed of 3.56+/-0.19 P and 0.60+/-0.13 In atoms. Experimental results were consistent with recent ab initio structural calculations and, furthermore, demonstrated that amorphous InP is best described by a Polk-like continuous random network, containing both even- and odd-membered rings. (C) 1999 American Institute of Physics. [S0003-6951(99)03112-5].
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页码:1713 / 1715
页数:3
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