Mechanical properties and indentation-induced damage of high-quality ZnO microwires

被引：5
作者：
Liu, Zhiwei [1 ]
Yan, Xiaoqin [1 ]
Lin, Zhi [1 ]
Huang, Yunhua [1 ]
Liu, Hanshuo [1 ]
Zhang, Yue [1 ,2 ]
机构：
[1] Univ Sci & Technol Beijing, State Key Lab Adv Met & Mat, Sch Mat Sci & Engn, Beijing 100083, Peoples R China
[2] Univ Sci & Technol Beijing, Key Lab New Energy Mat & Technol, Beijing 100083, Peoples R China
来源：
MATERIALS RESEARCH BULLETIN | 2012年 / 47卷 / 03期
关键词：
Oxides; Semiconductors; Vapor deposition; Mechanical properties; STRAIN-GRADIENT PLASTICITY; NANOBELTS; NANOWIRES; NANOINDENTATION;
D O I：
10.1016/j.materresbull.2011.12.008
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this paper, we aim to discover the mechanics-related novel phenomena on high-quality ZnO microwires through nanoindentation method. The mechanical property parameters of ZnO microwires were determined and a distinctive creep damage phenomenon was revealed. By using the cycles load mode in the nanoindentation experiments, the indentation size effect was demonstrated to exist in the ZnO microwires: the elastic modulus ranged from 65.9 GPa to 12.3 GPa and the hardness changed from 11.1 GPa to 1.8 GPa with the increase of indentation depth. Furthermore, the indentation-induced mechanical and electrical damage caused a permanent plastic deformation and an increase of 41% in the longitudinal conductance of the ZnO microwires. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码：750 / 754
页数：5
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