Mechanical properties and indentation-induced damage of high-quality ZnO microwires

被引：5

作者：

Liu, Zhiwei ^{[1
]}

Yan, Xiaoqin ^{[1
]}

Lin, Zhi ^{[1
]}

Huang, Yunhua ^{[1
]}

Liu, Hanshuo ^{[1
]}

Zhang, Yue ^{[1
,2
]}

机构：

[1] Univ Sci & Technol Beijing, State Key Lab Adv Met & Mat, Sch Mat Sci & Engn, Beijing 100083, Peoples R China

[2] Univ Sci & Technol Beijing, Key Lab New Energy Mat & Technol, Beijing 100083, Peoples R China

来源：

MATERIALS RESEARCH BULLETIN | 2012年 / 47卷 / 03期

关键词：

Oxides; Semiconductors; Vapor deposition; Mechanical properties; STRAIN-GRADIENT PLASTICITY; NANOBELTS; NANOWIRES; NANOINDENTATION;

D O I：

10.1016/j.materresbull.2011.12.008

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, we aim to discover the mechanics-related novel phenomena on high-quality ZnO microwires through nanoindentation method. The mechanical property parameters of ZnO microwires were determined and a distinctive creep damage phenomenon was revealed. By using the cycles load mode in the nanoindentation experiments, the indentation size effect was demonstrated to exist in the ZnO microwires: the elastic modulus ranged from 65.9 GPa to 12.3 GPa and the hardness changed from 11.1 GPa to 1.8 GPa with the increase of indentation depth. Furthermore, the indentation-induced mechanical and electrical damage caused a permanent plastic deformation and an increase of 41% in the longitudinal conductance of the ZnO microwires. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：750 / 754

页数：5

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