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Vertical Light Sheet Enhanced Side-View Imaging for AFM Cell Mechanics Studies
被引:39
作者:
Beicker, Kellie
[1
]
O'Brien, E. Timothy, III
[1
]
Falvo, Michael R.
[1
]
Superfine, Richard
[1
]
机构:
[1] Univ N Carolina, Dept Phys & Astron, Chapel Hill, NC 27599 USA
来源:
基金:
美国国家卫生研究院;
美国国家科学基金会;
关键词:
ATOMIC-FORCE MICROSCOPY;
LENS THETA MICROSCOPY;
FLUORESCENCE MICROSCOPY;
EXTRACELLULAR-MATRIX;
FOCAL ADHESIONS;
MECHANOTRANSDUCTION;
STIFFNESS;
CYTOSKELETON;
TOMOGRAPHY;
RESOLUTION;
D O I:
10.1038/s41598-018-19791-3
中图分类号:
O [数理科学和化学];
P [天文学、地球科学];
Q [生物科学];
N [自然科学总论];
学科分类号:
07 ;
0710 ;
09 ;
摘要:
The ability to measure dynamic structural changes within a cell under applied load is essential for developing more accurate models of cell mechanics and mechanotransduction. Atomic force microscopy is a powerful tool for evaluating cell mechanics, but the dominant applied forces and sample strains are in the vertical direction, perpendicular to the imaging plane of standard fluorescence imaging. Here we report on a combined sideways imaging and vertical light sheet illumination system integrated with AFM. Our system enables high frame rate, low background imaging of subcellular structural dynamics in the vertical plane synchronized with AFM force data. Using our system for cell compression measurements, we correlated stiffening features in the force indentation data with onset of nuclear deformation revealed in the imaging data. In adhesion studies we were able to correlate detailed features in the force data during adhesive release events with strain at the membrane and within the nucleus.
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