Carbon Nanotube atomic force microscopy probes

被引:0
|
作者
Yamanaka, S [1 ]
Okawa, T [1 ]
Akita, S [1 ]
Nakayama, Y [1 ]
机构
[1] Daiken Chem Co Ltd, Joto Ku, Osaka 5360011, Japan
来源
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIX, PTS 1-3 | 2005年 / 5752卷
关键词
CNT; AFM; STI; VIA; sticking;
D O I
10.1117/12.621263
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a carbon nanotube atomic force microscope probe. Because the carbon nanotube are well known to have high aspect ratios, small tip radii and high stiffness, carbon nanotube probes have a long lifetime and can be applied for the observation deep trenches. Carbon nanotubes were synthesized by a well-controlled DC arc discharge method, because this method can make nanotubes to have straight shape and high crystalline. The nanotubes were aligned on the knife-edge using an alternating current electrophoresis technique. A commercially available Si probe was used for the base of the nanotube probe. The nanotube probe was fabricated by the SEM manipulation method. The nanotube was then attached tightly to the Si probe by deposition of amorphous carbon. We demonstrate the measurement of a fine pith grating that has vertical walls. However, a carbon nanotube probe has a problem that is called "Sticking". The sticking is a chatter image on vertical like region in a sample. We solved this problem by applying 2 methods, 1. a large cantilever vibration amplitude in tapping mode, 2. an attractive mode measurement. We demonstrate the non-sticking images by these methods.
引用
收藏
页码:1450 / 1456
页数:7
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