Statistic properties of dislocation structures investigated by X-ray diffraction

The method of X-ray line profile analysis was applied to obtain statistical parameters (average dislocation density, net dislocation polarization and average dislocation density fluctuation) of the dislocation structure developed in copper single crystals deformed in uniaxial compression. It is found that during the plastic deformation, while the dislocation density increases monotonously, the average fluctuation has a maximum at the transition from stage II to stage m work hardening. The fractal properties of the dislocation structure are also investigated. Strong correlation was found between the fractal dimension and the relative dislocation density fluctuation. (C) 2001 Elsevier Science B.V. All rights reserved.