Sugarcane Stem Node Detection Based on Wavelet Analysis

The article discusses a wavelet-based approach for recognizing sugarcane stem nodes in order to improve pre-cut sugarcane planting technology, beginning with sugarcane form characteristics that permit automated sugarcane seed production. The location signal is collected by the acceleration and thin-film piezoelectric sensors and then decomposed into the tenth, eleventh, and twelfth layers using the Daubechies tight-branch wavelet. After capturing the signal, it is reconstructed and superimposed to capture the stem node region's features using the default threshold technique. A multi-sensor fusion approach is developed based on a weighted average and a Kalman filter to confirm the experiment's validity. The weighted average process produces an average value that is 0.3512 mm off from the experimentally observed data average. The discrepancy between the Kalman filter method's anticipated average value and the empirically determined average error is 0.5778 mm. To facilitate the investigation, 175 sugarcane samples with intermediate length processing are used. The detecting position system is determined experimentally after extensive experimental research and diligent examination. On average, the standard deviation is 0.494 mm, while the maximum value is 9.99 mm. 99.63 percent of cane seed samples are detected, with an error rate of 0.37 percent and a response time of 0.25 seconds. The proposed technology is conceptually feasible and achievable, and it can provide a reference for the development of automated cane seed pre-cutting machinery to give its contribution to agricultural production.